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Wei, S., A. Nahapetian, M. Nelson, F. Koushanfar, and M. Potkonjak, "Gate Characterization Using Singular Value Decomposition: Foundations and Applications", IEEE Transactions on Information Forensics and Security, vol. 7, issue 2, pp. 765-773, 4/2012. Abstract  Download: Gate_Characterization.pdf (846.21 KB)


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