Can EDA Combat the Rise of Electronic Counterfeiting?

TitleCan EDA Combat the Rise of Electronic Counterfeiting?
Publication TypeConference Paper
Year of Publication2012
AuthorsKoushanfar, F., S. Fazzari, C. McCants, W. Bryson, M. Sale, P. Song, and M. Potkonjak
Conference NameDesign Automation Conference (DAC)
Date PublishedJune, 2012
PublisherIEEE
Conference LocationCan EDA Combat the Rise of Electronic Counterfeiting?
KeywordsCounterfeiting, Device and IC aging, Reliability
Abstract

The Semiconductor Industry Associates (SIA) estimates that counterfeiting costs the US semiconductor companies $7.5B in lost revenue, and this is indeed a growing global problem. Repackaging the old ICs, selling the failed test parts, as well as gray marketing, are the most dominant counterfeiting practices. Can technology do a better job than lawyers? What are the technical challenges to be addressed? What EDA technologies will work: embedding IP protection measures in the design phase, developing rapid post- silicon certification, or counterfeit detection tools and methods?

Refereed DesignationRefereed
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PDF133.16 KB

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